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Call for Papers
Special Issue on: .Surface and Interface Analysis in Forensic Science.
Deadline for manuscripts: March 2009
Surface Science techniques such as mass spectrometry and X ray spectrometry are widely used by forensic practitioners around the world. In recent years, there has been a marked increase in the use of these techniques in case work. This is due in part to technological advances which have made analytical devices cheaper, more portable and more reliable. An additional element is that the advent of DNA evidence has dramatically changed the attitudes of police forces to high tech methods of solving crimes, and the evidential value of these techniques is now being realised in courtrooms across the globe.
We are currently soliciting manuscripts focused on the surface and interface analysis of specimens that are typically encountered in forensic investigations, and are extending the usual remit of the journal to include analysis techniques which are not quite so surface specific, such as x ray spectrometry, accelerator mass spectrometry and ion beam analysis.
For further details please contact either:
Dr Melanie Bailey
Guest Editor
University of Surrey
Email: m.bailey@surrey.ac.uk
or
Paul Trevorrow
Journal Editor
John Wiley and Sons, Ltd.
Email: ptrevorr@wiley.co.uk
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